Wide-field 3D Measurement Device 'VYA-1'
Achieve wide-field and high-resolution measurements with the combined function of segmented measurement!
Our company offers the wide-field 3D measurement device 'VYA-1', which utilizes multiple sensors and a split measurement integration function to achieve wide-field high-resolution 3D measurements. Additionally, it can import CAD data for matching and identification. It is also suitable for coplanarity inspection of various precision parts. 【Usage Examples】 ■ Measurement of products such as semiconductors and precision jigs ■ Shape measurement of flat substrates like OLEDs ■ Inspection of solder paste application ■ Shape inspection of various printing plates ■ Shape inspection of thin molds ■ Inspection of large PCB substrates *For more details, please download the PDF or feel free to contact us.
- Company：バリッジ
- Price：Other
